Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate
2007-02-28
2010-10-12
Clark, S. V (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Insulating material
C257S784000
Reexamination Certificate
active
07812440
ABSTRACT:
There is provided an electronic device package and the like in which it is not likely that damage occurs in a wiring pattern of an interposer substrate in a gap section formed, for example, between an electronic device and an insertion substrate. The semiconductor package in accordance with the present invention is a package of fan-out type including an interposer substrate and a semiconductor device and an insertion substrate which are arranged on the substrate. The interposer substrate3includes a wiring pattern therein. A gap is formed between the semiconductor device and the insertion substrate; in an area corresponding to the gap, a reinforcing member (a metallic film7) is formed to increase strength of the wiring pattern.
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Ohyachi Kenji
Shironouchi Toshiaki
Sogawa Yoshimichi
Yamazaki Takao
Clark S. V
Foley & Lardner LLP
NEC Corporation
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