Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2007-06-07
2008-08-05
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S076110, C714S735000
Reexamination Certificate
active
07408362
ABSTRACT:
An integrated circuit package includes at least two electronic circuits. A first of the at least two electronic circuits includes a digital input and a digital output and a test mode control line for setting the first integrated circuit chip into a determined test mode. The digital input includes at least two parallel input paths and the digital output includes at least two parallel output paths. The at least two parallel input paths and at least two parallel output paths provide a corresponding number of internal paths by which the first electronic circuit and a second electronic circuit can be tested essentially simultaneously.
REFERENCES:
patent: 4241307 (1980-12-01), Hong
patent: 6492798 (2002-12-01), Sunter
patent: 2002/0053056 (2002-05-01), Kuegler et al.
patent: 2004/0006752 (2004-01-01), Whetsel
patent: 2004/0181729 (2004-09-01), Whetsel
patent: 0430128 (1991-06-01), None
patent: 0273821 (1994-10-01), None
Ahmad Shakil
Kang Poh Sing
Singh Narang Jasmeet
Edell, Shaprio & Finnan LLC
Infineon - Technologies AG
Nguyen Vincent Q
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