Electronic inspection of an array

Details Electronic inspection of an array Electronic inspection of an array

2005-03-29

2005-03-29

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S765010, C324S1540PB

Reexamination Certificate

active

06873174

ABSTRACT:
A first signal line and a second signal line are paired, and in one signal line selection period, CPU of the inspection circuit controls a write circuit and writes analog signals into the first signal line selected by means of a switch of the selection circuit. In the next signal line selection period, CPU controls a read circuit and reads output signals from the second signal line selected by means of the switch. CPU detects a short circuit between the paired signal lines based upon the output signals from the second signal line.

REFERENCES:
patent: 5428300 (1995-06-01), Takahashi et al.
patent: 5608558 (1997-03-01), Katsumi
patent: 5994916 (1999-11-01), Hayashi
patent: 61-87197 (1986-05-01), None
patent: 4-52684 (1992-02-01), None
patent: 11-174486 (1999-07-01), None
patent: 11-296142 (1999-10-01), None
patent: 11-327518 (1999-11-01), None

Affiliated with

Also associated with

Rating

Electronic inspection of an array does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electronic inspection of an array, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic inspection of an array will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3403012