Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent
1994-12-13
1998-04-07
Epps, Georgia Y.
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
342179, G01J 304
Patent
active
057370753
ABSTRACT:
A new system for millimeter wave electronic imaging is described. This system utilizes a spatial light modulator in the focal plane of the collection optics. Each pixel of the modulator is driven by a specific high duty cycle modulation function provided by a modulation function generation circuit. Thus the throughput radiation at each pixel is uniquely labeled(encoded). A post modulation detector sums the signal from all the pixels. Subsequent to detection, the appropriate transform of the sum signal yields specific pixel throughput radiation intensity levels. Several configurations are described including one transmittance configuration and two reflectance configurations. Three specific millimeter wave transmittance embodiments and one reflectance embodiment are also described.
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Case William E.
Koch Mark E.
Bey Dawn-Marie
Epps Georgia Y.
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