Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate
2007-10-30
2007-10-30
Nguyen, Sang H. (Department: 2886)
Optics: measuring and testing
Lens or reflective image former testing
C356S124500, C359S383000, C359S385000
Reexamination Certificate
active
11636292
ABSTRACT:
An electronic imaging apparatus includes a connecting section connected to an optical apparatus; an optical element having a preset transmittance with respect to light in a preset wavelength region, incident from the optical apparatus; and an electronic image sensor receiving the light transmitted through the optical element.
REFERENCES:
patent: 4013347 (1977-03-01), Nakamura
patent: 4331132 (1982-05-01), Mukasa
patent: 4643540 (1987-02-01), Kawasaki et al.
patent: 5311304 (1994-05-01), Monno
patent: 5710663 (1998-01-01), Kawasaki
patent: 5896224 (1999-04-01), Kapitza
patent: 6384967 (2002-05-01), Watanabe et al.
patent: 6496308 (2002-12-01), Yonetani et al.
patent: 6594075 (2003-07-01), Kanao et al.
patent: 6608314 (2003-08-01), Hayashi
patent: 6674574 (2004-01-01), Aono
patent: 6917377 (2005-07-01), Aizaki et al.
Nonoda Yukio
Yamanouchi Kazuhiko
Yonetani Atsushi
Nguyen Sang H.
Olympus Corporation
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