Electronic devices having reduced destruction of internal elemen

Details Electronic devices having reduced destruction of internal elemen Electronic devices having reduced destruction of internal elemen

1996-10-01

1999-10-05

Donovan, Lincoln

Electrical resistors

Incased, embedded, or housed

With gaseous or vacuum spacing between element and casing or...

338 22R, 338236, 338225D, 174 526, H01C 800

Patent

active

059631252

ABSTRACT:
A positive thermistor device includes a positive thermistor element having a pair of opposed electrodes, each of which receives compressive force elastically applied from a corresponding one of spring contact members to hold the thermistor element at a predefined position in the device. When the thermistor device is destroyed, the element breaks into fragments, some of which remain in contact with the spring contact members. The remaining fragments deviate in position to ensure that they do not conduct electricity, resulting in an open state, wherein any current flow is inhibited through such fragments. More specifically, a positive thermistor disk is held within the device so that it is interposed between conductive spring contact pieces and insulative position-alignment projections, which are cross-diagonally situated with respect to each other. The spring contact pieces are located further toward the periphery of the disk than the position-alignment projections, causing a spring force to extend in a direction generally outward relative to a direction perpendicular to the planes of the electrodes. In one embodiment, the position-alignment projections have cut-away portions at outer tip ends thereof respectively to further promote the formation of an open circuit state upon the occurrence of malfunction.

REFERENCES:
patent: 4822980 (1989-04-01), Carbone et al.
patent: 4924204 (1990-05-01), Uchida
patent: 5117089 (1992-05-01), Honkomp et al.
patent: 5142265 (1992-08-01), Motoyoshi et al.
patent: 5606302 (1997-02-01), Ichida
Patent Abstracts of Japan, vol. 016, No. 294 (E-1225), Jun. 29, 1992, Japanese Patent Document No. 4-78102.
Patent Abstracts of Japan, E-1225, p. 73, JP 4-78103, Mar. 12, 1992.

Affiliated with

Also associated with

Rating

Electronic devices having reduced destruction of internal elemen does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electronic devices having reduced destruction of internal elemen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic devices having reduced destruction of internal elemen will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1176284