Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-01
2010-12-21
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07855567
ABSTRACT:
The invention provides a testing system and method suitable for determining whether the pins of the socket are properly connected to a printed circuit board. The testing system includes a testing signal source, a socket, a signal sensing unit, a fixing element, and an analysis unit. The signal sensing unit comprises a sensor board, a probe, and an operation amplifier. The sensor board is electrically coupled to the socket, and the sensor board has a probing point. The probe is selectively contacted with the probing point of the sensor board for receiving and outputting a sensing signal. The operation amplifier is electrically connected to the probe for receiving, amplifying and outputting the sensing signal. The fixing element is used for fixing the sensor board between the socket and the fixing element.
REFERENCES:
patent: 5254953 (1993-10-01), Crook et al.
patent: 5486753 (1996-01-01), Khazam et al.
patent: 5969530 (1999-10-01), Yamashita
patent: 6094056 (2000-07-01), Bardsley et al.
patent: 6104198 (2000-08-01), Brooks
patent: 6744267 (2004-06-01), Sauk et al.
patent: 6903360 (2005-06-01), McAuliffe
patent: 7208936 (2007-04-01), Goldsmith et al.
patent: 7437262 (2008-10-01), Boose et al.
patent: 7612568 (2009-11-01), Chen et al.
patent: 2008/0197867 (2008-08-01), Wokhlu et al.
patent: 2009/0089635 (2009-04-01), Chen et al.
Chen Hsin-Hao
Tsai Su-Wei
Baker & McKenzie LLP
Benitez Joshua
Nguyen Ha Tran T
Test Research, Inc.
LandOfFree
Electronic device testing system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electronic device testing system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic device testing system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4236902