Electronic device test method and apparatus

Details Electronic device test method and apparatus Electronic device test method and apparatus

1987-05-01

1988-10-04

Chaudhuri, Olik

Fishing, trapping, and vermin destroying

437172, 324158D, 350 9611, G01R 3126

Patent

active

047756403

ABSTRACT:
Apparatus for automatically testing LEDs formed in a wafer (11) includes a computer (15), a test probe (21) for applying a bias to an individual LED and a sensor probe (32) for positioning the test probe with respect to a contact (57) on the LED. Light from the LED is transmitted by an optical fiber (22) to opto-electronic equipment (18) for analysis and characterization by the computer (15). LED bias is provided by a pulse generator (35) and faulty diodes are marked by a marker probe (31). Each LED contains a lens portion (60) for directing LED light to the optical fiber (22).

REFERENCES:
patent: 3839781 (1974-10-01), Russell
patent: 4318587 (1982-03-01), Grassl
patent: 4489477 (1984-12-01), Chik et al.
patent: 4498730 (1985-02-01), Tanaka et al.
patent: 4516837 (1985-05-01), Soref et al.
patent: 4521069 (1985-06-01), Ikeda

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