Electronic device test handler

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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209573, 361380, G01R 3128

Patent

active

051840685

ABSTRACT:
A device for automatically presenting electronic devices to a tester for testing. A plurality of carriers, each for carrying a set of electronic devices are cyclically conveyed in a close loop from a loading stage where electronic devices are loaded onto the carriers, through a pre-test chamber, such as a "soak" chamber, from the pre-test chamber to a test stage where the devices are preferably lifted from the carrier to come into contact with a test head contactor for testing, from the test stage to a post-test chamber, such as "un-soak" chamber, through the post-test chamber to an unloading stage where the carriers are unloaded of the tested electronic devices, and then from the unloading stage back to the loading stage to receive a new set of untested electronic devices. Optionally, each carrier comprises a set of secondary carriers which ride in a like number of seats defined by a primary carrier and sets of electronic devices are loaded onto and unloaded from the secondary carriers. Among other uses, the secondary carriers serve as adapters between the various forms of electronic devices and a standard form of primary carrier.

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Fromer et al., "Chip Handler Apparatus for Testing Semiconductor Devices," IBM Technical Disclosure Bulletin; vol. 20, No. 3; Aug. 1977; pp. 1100-1101.

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