Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-07-25
2009-11-03
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C714S738000
Reexamination Certificate
active
07612575
ABSTRACT:
An apparatus having a plurality of test units (520), a loading transport unit (510) transporting a plurality of electronic devices from a customer tray (4C) to a test tray (4T) before being loaded in a test unit, and a classifying transport unit (530) transporting a plurality of electronic devices from a test tray while classifying them to customer trays in accordance with test results, the loading transport unit being provided at least at a frontmost stage of a plurality of test units, the classifying transport unit being provided at least at a rearmost stage of the plurality of test units, the test tray being successively conveyed from the frontmost stage to the rearmost stage of the plurality of test units in the state carrying electronic devices and returned from the rearmost stage test unit to the frontmost stage test unit.
REFERENCES:
patent: 5313156 (1994-05-01), Klug et al.
patent: 6078188 (2000-06-01), Bannai et al.
patent: 6314332 (2001-11-01), Kida
patent: 6518745 (2003-02-01), Kim et al.
patent: 6563331 (2003-05-01), Maeng
patent: 2003/0117161 (2003-06-01), Burns
patent: 2007/0013390 (2007-01-01), Kuitani et al.
patent: 11-023659 (1999-01-01), None
patent: 2000-241495 (2000-09-01), None
patent: 2002-174659 (2002-06-01), None
English language Abstract of JP 11-023659.
English language Abstract of JP 2000-241495.
English language Abstract of JP 2002-174659.
U.S. Appl. No. 11/444,425 to Mineo et al., which was filed on Jun. 1, 2006.
U.S. Appl. No. 10/599,374 to Kiyokawa et al., which was filed on Sep. 27, 2006.
U.S. Appl. No. 10/599,698 to Kikuchi et al., which was filed on Oct, 5, 2006.
U.S. Appl. No. 11/570,682 to Yamashita et al., which was filed on Dec. 15, 2006.
U.S. Appl. No. 11/610,043 to Mizushima et al., which was filed on Dec. 13, 2006.
Ito Akihiko
Kobayashi Yoshihito
Yamashita Kazuyuki
Advantest Corporation
Greenblum & Bernstein P.L.C.
Kusumakar Karen M
Nguyen Ha Tran T
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