Electronic device test apparatus and method of setting an...

Details Electronic device test apparatus and method of setting an... Electronic device test apparatus and method of setting an...

2005-11-09

2010-12-28

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07859248

ABSTRACT:
An electronic device test apparatus comprises: a contact arm making an IC device move and pushing it against a socket301; a control device controlling the contact arm; an instructing unit instructing the control device on a pushing torque of the contact arm; an acquiring unit acquiring from the tester the result whose a test of an IC device is executed when the contact arm pushes the IC device against the socket according to the torque instructed by the instructing unit; a correction unit correcting the torque on which the control device is instructed on the basis of the test result acquired by the acquiring unit; and a setting unit setting the stroke at the time when the test result is normal as an optimum stroke if the torque was not corrected by the correction unit.

REFERENCES:
patent: 6057700 (2000-05-01), Crispell
patent: 6069483 (2000-05-01), Maxwell et al.
patent: 6369595 (2002-04-01), Farnworth et al.
patent: 6456062 (2002-09-01), Yamashita et al.
patent: 7309981 (2007-12-01), Yamashita
patent: 7554349 (2009-06-01), Kang et al.
patent: 2005/0030007 (2005-02-01), Sakata
patent: 2007/0200555 (2007-08-01), Mizushima et al.
patent: 2007/0296432 (2007-12-01), Mineo et al.
patent: 2008/0038098 (2008-02-01), Ito et al.
patent: 2008/0042667 (2008-02-01), Yamashita et al.
patent: 5-259242 (1993-10-01), None
patent: 2003-258045 (2003-09-01), None
English language Abstract of JP 2003-258045, Sep. 12, 2003.
English language Abstract of JP 5-259242, Oct. 8, 1993.

Affiliated with

Also associated with

Rating

Electronic device test apparatus and method of setting an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electronic device test apparatus and method of setting an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic device test apparatus and method of setting an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4183534