Electronic device having an interface supported testing mode

Details Electronic device having an interface supported testing mode Electronic device having an interface supported testing mode

2007-10-31

2008-10-28

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07443188

ABSTRACT:
A system is provided for testing a logic device and an integrated circuit disposed within a semiconductor device package. The logic device may be configured to operate in at least a normal mode and a test mode. A terminal external to the semiconductor device package may be electronically coupled to the logic device and the integrated circuit. The terminal may be configured to operate as a shared input for the logic device and the integrated circuit. A multiplexer circuit may be configured to convey a first signal from the terminal to the logic device in the test mode, to convey a second signal from the integrated circuit to the logic device in the normal mode, and to receive a third signal from the integrated circuit for causing a transition between the normal mode and the test mode.

REFERENCES:
patent: 6457141 (2002-09-01), Kim et al.
patent: 7309999 (2007-12-01), Ong
patent: 2005/0236703 (2005-10-01), Kazi et al.

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