Electronic device for the measurement of time lags

Details Electronic device for the measurement of time lags Electronic device for the measurement of time lags

1992-06-17

1993-06-08

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Phase comparison

324617, 324 7677, 328223, 328113, G01S 1710

Patent

active

052182894

ABSTRACT:
The disclosure relates to the measurement of small time lags between a signal edge and a reference instant defined by another signal edge. It consists of the use of a signal edge for the prompting, by means of shock-excited resonating filters, of the appearance of two sinusoidal signals in quadrature constituting the components of a complex vector with a substantially constant module, the phase of said complex vector developing linearly in the course of time, and in deducing, from the value of this phase at the sampling reference instant, the value of the time lag between the reference instant and the signal edge. It can be applied more particularly to the measurement of short time lags of a few nanoseconds.

REFERENCES:
patent: 3680118 (1972-07-01), Anthony
patent: 3996588 (1976-12-01), Besson et al.
patent: 4063182 (1977-12-01), Besson
patent: 4139301 (1979-02-01), Chaborski
patent: 4165492 (1979-08-01), Motola et al.
patent: 5057910 (1991-10-01), Judge
Patent Abstracts of Japan, vol. 12, No. 319 (P-751) (3166) Aug. 30, 1988 & JP-A-63 085 489 (Yokogawa Electric) Apr. 15, 1988.
Patent Abstracs of Japan, vol. 11, No. 260 (P-608) (2707) Aug. 22, 1987 & JP-A-62 063 885 (Yokogawa Electric) Mar. 20, 1987.

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