Electronic device, failure prediction method, and computer...

Details Electronic device, failure prediction method, and computer... Electronic device, failure prediction method, and computer...

2004-06-23

2008-12-23

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S185000, C714S048000

Reexamination Certificate

active

07469189

ABSTRACT:
An electronic device that includes a part prone to aged deterioration includes an environmental load applying unit that applies a higher environmental load on the part than an environmental load in a normal operation, an error detecting unit that detects an error in the part with the higher environmental load applied, and a failure predicting unit that predicts a failure of the part based on the error detected.

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