Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2005-09-06
2005-09-06
Graybill, David E. (Department: 2827)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S431000, C257S448000, C257S741000, C257S753000, C257S758000, C257S763000, C257S770000, C257S098000, C257S099000, C257S751000
Reexamination Certificate
active
06940094
ABSTRACT:
An electronic device is provided using wiring comprising aluminum to prevent hillock or whisker from generating, wherein the wiring contains oxygen atoms at a concentration of 8×1018atoms·cm−3or less, carbon atoms at a concentration of 5×1018atoms·cm−3or less, and nitrogen atoms at a concentration of 7×1017atoms·cm−3or less; furthermore, a silicon nitride film is formed on the aluminum gate, and an anodic oxide film is formed on the side planes thereof.
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Prosecution History of U.S. Patent 5,929,527 (Exhibit 2 of Expert Witness Report if Ian D. Hutcheon; U.S. Patent 5,929,527 is Exhibit 1).
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Jochonia Nxumalo, A Prior Art Analysis of U.S. Patent No. 5,929,527 on the Intel A80502-75 SX969 Pentium Microprocessor (Exhibit 7 of Expert Witness Report of Ian D. Hutcheon).
Jochonia Nxumalo, A Prior Art Analysis of U.S. Patent No. 5,929,527 on the Intel A80502-75 [sic, A80502-90] SX879 Pentium Microprocessor (Exhibit 8 of Expert Witness Report of Ian D.
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SEL's Opening Brief on Claim Construction and Supporting Evidence (Mar. 1, 2003).
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Declaration of L. Rafael Reif in Support of SEL's Opening Brief on Claim Construction and Supporting Evidence (Mar. 4, 2003).
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Declaration of Brian D. Henri regarding SEL's Amended Opening Brief on Claim Construction and Supporting Evidence (Mar. 7, 2003).
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Acer Incorporated and Acer American Corporation's Comments on Tentative Claim Construction Order (May 5, 2003).
AU Optronics' Objection to Submission of Improper Extrinsic Evidence with SEL's Response to the Court's Apr. 28, 2003 Tentative Claim Construction Order (May 6, 2003).
Acer Incorporated and Acer America Corporation's Preliminary Proposed Constructions of Identified Claim Terms (Dated: Jan. 27, 2003).
Preliminary Proposed Construction of Identified Claim Terms by AU Optronics Corporation (Dated: Jan. 27, 2003).
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Case No. C 02-02800 WHA; Declaration of L. Rafael Reif in Support of SEL's Oppositi
Teramoto Satoshi
Yamazaki Shunpei
Fish & Richardson P.C.
Graybill David E.
Semiconductor Energy Laboratory Co,. Ltd.
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