Electronic component testing socket and electronic component...

Details Electronic component testing socket and electronic component... Electronic component testing socket and electronic component...

2005-08-23

2005-08-23

Nguyen, Truc (Department: 2833)

Electrical connectors

Having retainer or passageway for fluent material

C439S198000

Reexamination Certificate

active

06932635

ABSTRACT:
To control the temperature of an electronic component testing socket without mixing any noise into a test signal to be applied to an electronic component and a respond signal to be read from the electronic component when conducting a test on the electronic component, a first space67in the electronic component testing socket base6and a socket body inside space75in the electronic component testing socket7are connected via a gas outlet65and a gas inlet76, and a second space68in the electronic component testing socket base6and a socket body inside space75in the electronic component testing socket7are connected via a gas inlet66and a gas outlet77.

REFERENCES:
patent: 5335553 (1994-08-01), Ueki et al.
patent: 5576937 (1996-11-01), Kubo
patent: U-59-74729 (1984-05-01), None
patent: A-61-065173 (1986-04-01), None
patent: U-01-151266 (1989-10-01), None
patent: A-2001-051017 (2001-02-01), None

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