Electronic component test apparatus

Details Electronic component test apparatus Electronic component test apparatus

2006-09-19

2006-09-19

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S761010

Reexamination Certificate

active

07109732

ABSTRACT:
A test apparatus and method in which a compressible housing is used to retain an electronic component having conductors thereon. The compressible housing is lowered onto a suitable base member having upstanding probes which are also compressible and which physically engage respective ones of the conductors at one end thereof and an appropriate conductor (e.g., conductive pads on a printed circuit board) on the other when the test apparatus is fully assembled and testing occurs.

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IBM Technical Disclosure Bulletin, vol. 25, No. 11B, Apr. 1983, pp. 6265-6266, “Spring Loaded Probe with Rotational Wiping Feature”.
IBM Technical Disclosure Bulletin, vol. 37, No. 02B, Feb. 1994, pp. 603-604, “Tini-Probe Interposer Connector”.

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