Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-07-19
2005-07-19
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06919733
ABSTRACT:
An electronic component production method for subjecting an electronic component to burn-in, in which a load equivalent to a predetermined load defined by a burn-in temperature, a burn-in voltage, and a burn-in time is applied to the electronic component, includes a first step of setting the temperature of the electronic component to a predetermined temperature which is lower than the burn-in temperature; a second step of applying constant power to the electronic component to increase the temperature of the electronic component from the predetermined temperature to the burn-in temperature; and a third step of comparing an actual voltage which is applied to the electronic component at the burn-in temperature with the burn-in voltage and correcting the burn-in time based on the difference therebetween to determine a corrected burn-in time, and applying the constant power to the electronic component for the corrected burn-in time.
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patent: 5473259 (1995-12-01), Takeda
patent: 6574763 (2003-06-01), Bertin et al.
patent: 6-102312 (1994-04-01), None
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patent: 2000-208380 (2000-07-01), None
Murata Manufacturing Co. Ltd.
Ostrolenk Faber Gerb & Soffen, LLP
Tang Minh N.
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