Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2004-06-14
2009-06-23
Wu, Jingge (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S149000
Reexamination Certificate
active
07551765
ABSTRACT:
The present invention provides a method and a system for determining whether a target component of an electronic assembly is assembled correctly. The method of the present invention involves correlating the view of a test electronic assembly with both a positive control image and a negative control image. The positive control image is an image of an electronic assembly that has been assembled properly, whereas the negative control image is an image of an electronic assembly that has been assembled improperly. If the correlation between the test image and the positive control image is greater than the correlation between the test image and the negative control image, the test assembly is assembled properly. On the other hand, if the correlation between the test image and the negative control image is greater than the correlation between the test image and the positive control image, the test assembly is assembled improperly.
REFERENCES:
patent: 6137893 (2000-10-01), Michael et al.
patent: 6701003 (2004-03-01), Feinstein
patent: 6748104 (2004-06-01), Bachelder et al.
patent: 2002/0186878 (2002-12-01), Hoon et al.
Garner Timothy D.
Thomas Steven P.
Abdi Amara
Delphi Technologies Inc.
Funke Jimmy L.
Wu Jingge
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