Electronic component comprising a coil conductor and a...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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Details

C257S532000, C257S533000, C257S535000, C257S528000, C257S508000, C257S275000, C257S277000, C257S307000, C257SE21022, C257SE29343, C257SE23144, C361S311000, C361S821000, C336S200000, C438S239000

Reexamination Certificate

active

07859080

ABSTRACT:
The invention provides an electronic component which has an improved breakdown limit value of withstand voltage and improved insulation properties and which can be made compact and provided with a multiplicity of layers and a great capacity. The electronic component includes a first conductor having a bottom conductor formed on a substrate and a raised conductor formed to protrude from the bottom conductor, a dielectric film formed on the raised conductor, and a second conductor formed on the dielectric film to constitute a capacitor element in combination with the raised conductor and the dielectric film.

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patent: 2002-033559 (2002-01-01), None
patent: 2003-017366 (2003-01-01), None
patent: A-2003-45742 (2003-02-01), None
patent: A-2004-342929 (2004-12-01), None
Siliconfareast.com document for conventional dielectric rates.

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