Electronic circuit tester and method of testing electronic circu

Details Electronic circuit tester and method of testing electronic circu Electronic circuit tester and method of testing electronic circu

1997-04-25

1998-09-01

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324751, G01R 3128

Patent

active

058015400

ABSTRACT:
A failure analysis equipment for an electronic circuit, includes a voltage supply for supplying a constant voltage to a wiring of an electronic circuit to be analyzed, an energy beam or fluid jet generator, an apparatus for irradiating the energy beam or fluid jet to the wiring to thereby vary a temperature and hence an electrical resistance of the wiring, a detector for detecting a current running through the wiring, and a comparator for comparing the current with a current which is to run if no failure exists in the wiring, thereby determining whether the wiring is in failure or not. As a result a current flow running through a wiring of an electronic circuit to be analyzed may be increased, and make a failure analysis may be conducted without contact to and construction of the electronic circuit.

REFERENCES:
patent: 4588950 (1986-05-01), Henley
patent: 4695794 (1987-09-01), Bargett et al.
patent: 4761607 (1988-08-01), Shiragasawa et al.
patent: 4837506 (1989-06-01), Patterson
"A Method of Detecting Hot Spots on Semiconductors Using Liquid Crystals"; John Hiatt;CH 1619-6/81/0000-0130, pp. 130-133, 1981; IEEE/PROC. IRPS. (unavailable month).

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