Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1997-03-04
1999-05-04
Barlow, John
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
371 275, 371 221, 371 211, G01R 313183
Patent
active
058999612
ABSTRACT:
This invention relates to electronic circuit testing and more particularly to an apparatus utilizing data compression techniques. An electronic circuit or board tester according to the invention includes one tester circuit with the combination of a sequencer and a vector-sequencer-memory per pin. A data-sequence, such as a loop to address the memory cells of an electronic memory one after the other in a predetermined chronological order, is applied to a pin of a device under test and is compressed in order to save memory space.
REFERENCES:
patent: 4656632 (1987-04-01), Jackson
patent: 5499248 (1996-03-01), Behrens et al.
patent: 5579493 (1996-11-01), Kiuchi et al.
patent: 5696772 (1997-12-01), Lesmeister
Barlow John
Hewlett--Packard Company
Shah Kamini
LandOfFree
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