Electronic circuit or board tester and method of testing an elec

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371 221, G01R 3128

Patent

active

056549717

ABSTRACT:
This invention relates to electronic circuit testing and more particularly to an apparatus and a method utilizing enhanced test data compression techniques. An electronic circuit or board tester according to the invention includes one tester circuit with a combination of a sequencer and a vector-sequencer-memory per pin. The test-data-sequence to be applied to a pin of a device under test is compressed in order to save memory space.

REFERENCES:
patent: 4652814 (1987-03-01), Groves et al.
patent: 5001418 (1991-03-01), Posse et al.
patent: 5025205 (1991-06-01), Mydill et al.
patent: 5513188 (1996-04-01), Parker
European Search Report, EP 95 11 2576, 5 Feb. 1996.

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