Electronic circuit for measurement of transistor variability...

Details Electronic circuit for measurement of transistor variability... Electronic circuit for measurement of transistor variability...

2011-08-23

2011-08-23

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08004305

ABSTRACT:
An electronic circuit includes an output terminal and at least a first measuring FET. The second drain-source terminals of a plurality of FETS to be tested are interconnected with the first drain-source terminal of the first measuring FET and the output terminal. The second drain-source terminal of the first measuring FET is interconnected with a first biasing terminal. The first drain-source terminals of the FETS to be tested are interconnected with a second biasing terminal. A state machine is coupled to the gates of the FETS to be tested and the gate of the first measuring FET. The state machine is configured to energize the gate of the first measuring FET and to sequentially energize the gates of the FETS to be tested, so that an output voltage appears on the output terminal. Circuitry to compare the output voltage to a reference value is also provided. The gate of the first measuring field effect transistor is energized; the gates of the field effect transistors to be tested are sequentially energized, whereby an output voltage appears on the output terminal; and the output voltage is compared to the reference value.

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Terada. K. et al. “A Test Circuit for Measuring MOSFET Threshold Voltage Mismatch.” Microelectronic Test Structures, 2003, International Conference, Mar. 2003, pp. 227-231.
Agarwal, K. et al. “A Test Structure for Characterizing Local Device Mismatches.” Proceeding of Symposium on VLSI Circuits, pp. 67-68, 2006.
Drego, N. et al. “A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays.” Microsystems Technology Laboratories, MIT, Cambridge, MA, 2007.
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