Electronic circuit device with reduced breaking and cracking

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame

Reexamination Certificate

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Details

C257SE23036, C257SE23051, C257SE23066, C257SE25031, C257SE23023, C257SE23043, C257SE23052, C257S676000, C257S775000, C257S776000, C257S723000, C257S685000, C257S686000, C257S777000, C257S702000, C257S703000, C257S705000, C257S773000, C257S528000, C257S533000, C257S712000, C257S675000, C257S724000, C257S725000, C257S728000

Reexamination Certificate

active

10628443

ABSTRACT:
In an electronic circuit device including a substrate including a front surface on which an electronic circuit element is mounted and a reverse surface opposite to the front surface in a thickness direction of the substrate, an electrically conductive terminal member electrically connected to the electronic circuit element, a lead frame extending perpendicular to the thickness direction to face the reverse surface in the thickness direction, and a sealing resin covering at least partially the electronic circuit element, substrate and lead frame while at least a part of the electrically conductive terminal member is prevented from being covered by the sealing resin, the substrate extends to project outward from an end of the lead frame in a transverse direction perpendicular to the thickness direction while the end of the lead frame is covered by the sealing resin.

REFERENCES:
patent: 4195193 (1980-03-01), Grabbe et al.
patent: 4933744 (1990-06-01), Segawa et al.
patent: 5212405 (1993-05-01), Oigawa
patent: 5455453 (1995-10-01), Harada et al.
patent: 5475259 (1995-12-01), Kasai et al.
patent: 6187614 (2001-02-01), Takata et al.
patent: 6396138 (2002-05-01), Cheah
patent: 6475827 (2002-11-01), Lee et al.
patent: 6484708 (2002-11-01), Hirakawa et al.
patent: 6559525 (2003-05-01), Huang
patent: 7061080 (2006-06-01), Jeun et al.
patent: 2002/0192488 (2002-12-01), Kurihara et al.
patent: 2003/0001252 (2003-01-01), Ku et al.
patent: 2003/0201530 (2003-10-01), Kurihara et al.
patent: 2004/0061217 (2004-04-01), Ku et al.
patent: 2004/0084756 (2004-05-01), Kawakami et al.
patent: 2004/0145043 (2004-07-01), Hayashi et al.
patent: 0484180 (1991-01-01), None
patent: 63-5647 (1988-01-01), None
patent: 2-49140 (1990-04-01), None
patent: 5-82573 (1993-04-01), None
patent: 7-249729 (1995-09-01), None
patent: 09-232341 (1997-09-01), None
patent: 10-116934 (1998-05-01), None
patent: 10-303341 (1998-11-01), None
patent: 2000-183241 (2000-06-01), None
patent: 2003-115681 (2003-04-01), None
patent: 2004-273946 (2004-09-01), None
A. Nishimura et al.,IEEE Transactions on Components, Hybrids, and Manufacturing Technology; vol. 12, No. 4, pp. 639-645 (Dec. 1989).
German Office Action dated May 3, 2006 including English Translation (Ten (10) pages).
Japanese Office Action dated Oct. 10, 2006 including English translation (three (3) pages).

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