Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate
2005-09-13
2005-09-13
Williams, Alexander Oscar (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Insulating material
C257S713000, C257S712000, C257S710000, C257S778000, C257S737000, C257S738000, C257S685000, C257S723000, C257S777000, C257S686000, C257S784000, C257S668000, C257S675000
Reexamination Certificate
active
06943443
ABSTRACT:
Bumps are formed on electrodes of semiconductor elements, and moreover, the semiconductor elements with the bumps are electrically connected to metallic members having installation members, whereby wiring lines are eliminated. Stray inductance and conduction resistance resulting from wiring lines can be reduced. A conventional dented connector and a projecting connector are eliminated by connecting the installation members to a second circuit board, thereby enabling an electronic circuit device of a power control system to be made compact.
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Ikeda Satoshi
Kato Yasushi
Nakajima Yasufumi
Nobori Kazuhiro
Matsushita Electric - Industrial Co., Ltd.
Williams Alexander Oscar
LandOfFree
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