Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Magnetic saturation
Reexamination Certificate
2011-07-05
2011-07-05
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Magnetic saturation
Reexamination Certificate
active
07973527
ABSTRACT:
An electronic circuit includes a magnetoresistance element for providing an output signal proportional to a magnetic field. The magnetoresistance element also has a hysteresis characteristic. The electronic circuit also includes at least one of a reset conductor or a bias conductor disposed proximate to the magnetoresistance element. For embodiments having a reset conductor, the electronic circuit is configured to generate a reset current carried by the reset conductor in response to the comparison. In response to the reset current, the reset conductor is configured to generate a reset magnetic field at the magnetoresistance element to temporarily force the magnetoresistance element to a saturation region of the hysteresis characteristic.
REFERENCES:
patent: 4385283 (1983-05-01), Delapierre
patent: 5247278 (1993-09-01), Pant et al.
patent: 5521501 (1996-05-01), Dettmann et al.
patent: 5561366 (1996-10-01), Takahashi et al.
patent: 5686838 (1997-11-01), Van den Berg
patent: 5831426 (1998-11-01), Black, Jr. et al.
patent: 6071655 (2000-06-01), Faulconer
patent: 6094330 (2000-07-01), Criniti et al.
patent: 6316931 (2001-11-01), Nakagawa et al.
patent: 6323634 (2001-11-01), Nakagawa et al.
patent: 6411078 (2002-06-01), Nakagawa et al.
patent: 6424018 (2002-07-01), Ohtsuka
patent: 6429640 (2002-08-01), Daughton et al.
patent: 6433981 (2002-08-01), Fletcher et al.
patent: 6445171 (2002-09-01), Sandquist et al.
patent: 6462531 (2002-10-01), Ohtsuka
patent: 6544078 (2003-04-01), Palmisano et al.
patent: 6566856 (2003-05-01), Sandquist et al.
patent: 6642705 (2003-11-01), Kawase
patent: 6667682 (2003-12-01), Wan et al.
patent: 6683448 (2004-01-01), Ohtsuka
patent: 6759841 (2004-07-01), Goto et al.
patent: 6791313 (2004-09-01), Ohtsuka
patent: 6812687 (2004-11-01), Ohtsuka
patent: 6841989 (2005-01-01), Goto et al.
patent: 6970333 (2005-11-01), Boeve
patent: 6989665 (2006-01-01), Goto
patent: 7248045 (2007-07-01), Shoji
patent: 7336064 (2008-02-01), Ludwig et al.
patent: 7495624 (2009-02-01), Daalmans
patent: 2002/0180431 (2002-12-01), Torok et al.
patent: 2006/0071655 (2006-04-01), Shohi
patent: 2006/0091993 (2006-05-01), Shoji
patent: 2006/0114098 (2006-06-01), Shoji
patent: 2006/0145690 (2006-07-01), Shoji
patent: 2006/0170529 (2006-08-01), Shoji
patent: 2006/0291106 (2006-12-01), Shoji
patent: 2007/0044370 (2007-03-01), Shoji
patent: 2007/0076332 (2007-04-01), Shoji et al.
patent: 2007/0090825 (2007-04-01), Shoji
patent: 2007/0096716 (2007-05-01), Shoji
patent: 2007/0188946 (2007-08-01), Shoji
patent: 2009/0212765 (2009-08-01), Doogue et al.
patent: 2009/0315543 (2009-12-01), Guo et al.
patent: 2010/0001715 (2010-01-01), Doogue et al.
patent: 2010/0026288 (2010-02-01), Sauber et al.
patent: 10017374 (2000-12-01), None
patent: 10159607 (2002-09-01), None
patent: 10128150 (2003-01-01), None
patent: 10155423 (2003-05-01), None
patent: 10202287 (2003-08-01), None
patent: 10222395 (2003-12-01), None
patent: 102004003369 (2005-08-01), None
patent: 102004009267 (2005-09-01), None
patent: 102004038847 (2005-09-01), None
patent: 102004040079 (2005-12-01), None
patent: 102005037905 (2006-03-01), None
patent: 102004053551 (2006-05-01), None
patent: 102006008257 (2006-10-01), None
patent: 102006021774 (2007-01-01), None
patent: 102005038655 (2007-03-01), None
patent: 102005040539 (2007-03-01), None
patent: 10 2005 037 036 (2007-04-01), None
patent: 10 2005 037 036 (2007-04-01), None
patent: 102005052688 (2007-05-01), None
patent: 102006007770 (2007-08-01), None
patent: 102006028698 (2007-12-01), None
patent: 102006046736 (2008-04-01), None
patent: 102006046739 (2008-08-01), None
patent: WO 2006/136577 (2006-12-01), None
patent: WO 2007/147760 (2007-12-01), None
Sauber et al.; U.S. Appl. No. 12/183,106, filed Jul. 31, 2008.
Taylor et al.; “A Spin-Valve Based SOIC8 Current Sensor;” Allegro MicroSystems, Inc. Manuscript; Revised Aug. 17, 2006; pp. 1-4.
Yamada et al.; “Eddy-Current Testing Probe with Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection;” IEEE Transactions on Magnetics; vol. 40; Jul. 2004; pp. 2676-2678.
Office Action dated Mar. 18, 2011 for U.S. Appl. No. 12/183,106.
Doogue Michael C.
Taylor William P.
Allegro Microsystems Inc.
Daly, Crowley & Mofford & Durkee, LLP
Hollington Jermele M
LandOfFree
Electronic circuit configured to reset a magnetoresistance... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electronic circuit configured to reset a magnetoresistance..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic circuit configured to reset a magnetoresistance... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2685036