Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1977-07-06
1979-10-02
Woodiel, Donald O.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
73359R, 364557, 364571, 235 92PL, G01K 120
Patent
active
041693809
ABSTRACT:
A display device has its input information subject to a non-linear processing in order to compensate for the non-linearity of a sensor or in order to enhance the display. The input is periodically read and after processing is converted to a time signal by means of a down counter fed with clock pulses. The time signal is used to control the dwell time of a beam of an oscilloscope or the pen lift mechanism of a chart recorder.
REFERENCES:
patent: 3824585 (1974-07-01), Meijer
patent: 4031530 (1977-06-01), Aneshansley
patent: 4055166 (1977-10-01), Simpson et al.
Baines Terence
Mansfield Peter
National Research Development Corporation
Woodiel Donald O.
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