Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Patent
1989-03-27
1991-01-08
Anderson, Bruce C.
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
250397, H01J 3730
Patent
active
049838644
ABSTRACT:
An electron beam drawing apparatus having a grounded conductor for a screening operation in the neighborhood of a detection surface of a detector to detect a reflected electrons obtained by irradiating an electron onto a specimen and a secondary electron generated through the electron irradiation. The conductor has openings to pass therethrough the reflected electron and the secondary electron. As a result, the electric charge accumulated on an organic substance fixed onto the front surface of the detector through the electron irradiation is prevented from exerting an influence on the drawing electron beam.
REFERENCES:
patent: 4812651 (1989-03-01), Feuerbaum et al.
patent: 4829177 (1989-05-01), Hirsch
patent: 4857742 (1989-08-01), Kato et al.
T. H. Newman, et al., "High Resolution Patterning System with Single Bore Object Lens", Journal of Vacuum Science and Technology, B vol. 5, No. 1, Jan./Feb. 1987, pp. 88-91, (in English).
J. C. Edison, et al., "A High Speed Electron Beam Lithography System", Journal of Vacuum Science and Technology, 19(4), Nov./Dec. 1981, pp. 932-935, (in English).
Murai Fumio
Okazaki Shinji
Anderson Bruce C.
Hitachi , Ltd.
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