Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Patent
1995-01-30
1996-10-29
Anderson, Bruce C.
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
250305, 250310, 378 43, H01J 3700
Patent
active
055699162
ABSTRACT:
An electron spectroscopy apparatus in which pulses of EUV of a prescribed wavelength are generated from plasma produced by pulsed laser beam irradiation of a target containing specific elements, the EUV pulses are used to irradiate a specimen, producing an emission of photoelectrons from the specimen, and the time it takes these photoelectrons to pass along a flight channel is measured and analyzed.
REFERENCES:
patent: 3826996 (1974-07-01), Jaegle et al.
patent: 4229708 (1980-10-01), Mani et al.
patent: 4255656 (1981-03-01), Barrie et al.
patent: 4435828 (1984-03-01), Epstein et al.
patent: 4484339 (1984-11-01), Mullozzi et al.
patent: 4486659 (1984-12-01), Turner
patent: 4680467 (1987-07-01), Bryson
patent: 4771430 (1988-09-01), Suckewe et al.
patent: 4896341 (1990-01-01), Forsyth et al.
patent: 5022064 (1991-06-01), Iketaki
patent: 5132994 (1992-07-01), Kato
patent: 5148462 (1992-09-01), Spitsyn et al.
patent: 5175757 (1992-12-01), Augustoni et al.
patent: 5450463 (1995-09-01), Iketaki
Nuclear Instruments and Methods, vol. 208, 1983, pp. 735-752, B. Sonntag, "Photoemission from Atoms and Molecules".
Appl. Phys. Lett., vol. 56, No. 19, May 7, 1990, Harald Ade, et al., "X-Ray Spectromicroscopy with a Zone Plate Generated Microphobe".
Agency of Industrial Science & Technology, Ministry of Internati
Anderson Bruce C.
LandOfFree
Electron spectroscopy apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electron spectroscopy apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron spectroscopy apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1787636