Electron spectrometer

Details Electron spectrometer Electron spectrometer

1987-05-18

1988-07-19

Anderson, Bruce C.

Radiant energy

Electron energy analysis

250307, H01J 4000

Patent

active

047587237

ABSTRACT:
There is provided an electron spectrometer operable to produce an image of an electron emitting surface, said spectrometer comprising in sequence:

REFERENCES:
patent: 3733483 (1973-05-01), Gren et al.
patent: 3937957 (1976-02-01), Schillalies et al.
patent: 4358680 (1982-11-01), Read
"Field Emission Deflection Energy Analyzer", Kayatt et al., Rev. of Sci. Inst., vol. 43, No. 1, Jan. 1972, pp. 108-111, 250-305.
Turner D. W. et al., Journal of Microscopy, 1984, vol. 136, No. 2, pp. 259-277.
Hovland C. T., Third International Conference on Solid Surfaces, Vienna, 1973, pp. 2363-2366.
Gurker N. et al., Surface & Interface Analysis, 1983, vol. 5(1), pp. 13-19.
Watanabe H. and Uyeda R., J. Phys. Soc. Japan, 1962, vol. 17, pp. 569 to 570.
Cundy S. L. et al., J. Sci. Instrum., 1966, vol. 43, pp. 712-715.
Wittry D. B., Brit. J. App. Phys., 1969, vol. 2, pp. 1757-1766.
Crewe A. V. et al., Rev. Sci. Instrum., 1971, vol. 42(4), pp. 411-420.
Andrew J. W. et al., Proc. 9th Int. Congress on Electron Microscopy, Toronto, 1978, vol. 1, pp. 40-41.
Egerton R. F. et al., J. Phys. E., 1975, vol. 8, pp. 1033-1037.
Castaing R. and Henry L., J. Microscopie, 1964, vol. 3(2), pp. 133-152.
Mollenstedt G. and Rang O., Z. Angew. Physik. 1951, vol. 3(5), pp. 187 to 189.
Cazaux J., Ultramicroscopy, 1984, vol. 12, pp. 321-332.
Lampton M. and Malina R. F., Review of Scientific Instruments, 1976, vol. 47(11), pp. 1360-1362.
Brundle C. R. et al., J. Electron Spectroscopy & Related Phenomena, 1974, vol. 3, pp. 241-261.
Beamson G. et al., Nature, 1981, vol. 290, pp. 556-561.
Plummer et al., J. Molecular Structure, 1982, vol. 79, pp. 145-162.
Dixon A. J., Scanning Electron Microscopy, 1984, vol. 1, pp. 55-66.
Polack F. and Lowenthal S., Journal de Physique, 1984, vol. 45, pp. C2-73 to C2-76.
Ottensmeyer F. P., Electron Optical Systems, 1984, pp. 245-251.

Affiliated with

Also associated with

Rating

Electron spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron spectrometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-598765