Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Using radiant energy
Patent
1982-05-14
1984-02-28
Tokar, Michael J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Using radiant energy
250397, G01R 3100
Patent
active
044343990
ABSTRACT:
Electrical signals are measured (analyzed and displayed) with picosecond resolution and sensitivity in the microvolt (less than 100 microvolts) range by electron-optically sampling the signal. Sampling electron bursts are produced in response to a train of subpicosecond optical pulses. A beam of these electron bursts samples successive portions of the signal as it is transmitted as a travelling wave along deflection plates which act as a transmission line. The bursts are deflected in accordance with the amplitude of the successive portions of the signal and translated into spots of light, as on a phosphor screen. The deflection is significantly less than the diameter of the spot. The deviation of the spot with respect to the position thereof in the absence of the signal on the deflection plates is translated into a difference output. The signal to be analyzed is generated, synchronously with the optical pulses, to propagate along the deflection plates in variably delayed relationship therewith. The signal is optically-induced using a separate beam of the optical pulses which is desirably chopped into optical pulses. The difference output is processed, preferably by a lock-in amplifier and signal averager; the lock-in amplifier being synchronized with the chopping of the beam into the optical pulses, and displayed on a time base synchronous with the variable delay of the optical pulses. Accordingly, the signal is displayed on an expanded time scale for measurement and other analysis.
REFERENCES:
patent: 3917943 (1975-11-01), Auston
patent: 3921028 (1975-11-01), Fujisawa
patent: 4118627 (1978-10-01), Porter
patent: 4382182 (1983-05-01), Matsuzaka
D. H. Auston et al., Picosecond Optoelectronic Detection, Sampling and Correlation Measurements in Amorphous Semiconductors, Appl. Phys. Lett., 37(4), 15 Aug. 1980, pp. 371-373.
Mourou Gerard
Valdmanis Janis A.
Williamson Steven L.
Lukacher Martin
The University of Rochester
Tokar Michael J.
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