Electron optical component

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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Details

C250S400000, C250S398000, C250S3960ML, C250S305000

Reexamination Certificate

active

07608838

ABSTRACT:
An electron optical component used to improve the spatial resolution in magnetic projection electron lenses or other electron optical devices by filtering the cyclotron orbit radii of electron trajectories in the lens magnetic field.

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patent: 2003/0010934 (2003-01-01), Katsap et al.
Beamson et al., ‘Photoelectron spectromicroscopy’ Nature vol. 290, p. 556, 1981.
Kim et. al. Review of Scientific Instruments, ‘Construction of a new imaging bandpass analyzer for a magnetic projection photoelectron microscope’ vol. 66(5) p. 3159, 1995.
Pianetta et al., ‘Core level photoelctron microscopy with synchrotron radiation’ Review of Scientific Instruments, vol. 60 (7) p. 1686. 1989.

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