Photography and optical equipment – Optical article not elsewhere specified – Microscope
Design Patent
2011-03-01
2011-03-01
Greene, Paula (Department: 2912)
Photography and optical equipment
Optical article not elsewhere specified
Microscope
Design Patent
active
D0633538
CLAIM:
The ornamental design for an electron microscope, as shown and described.
REFERENCES:
patent: D141832 (1945-07-01), Holley
patent: D170065 (1953-07-01), Petterson
patent: D172780 (1954-08-01), Briskin et al.
patent: D182698 (1958-04-01), Wells
patent: 3551019 (1970-12-01), Michel
patent: D225580 (1972-12-01), Reinecke
patent: D299861 (1989-02-01), Hunsdale et al.
patent: 4812029 (1989-03-01), Onanhian
patent: D332616 (1993-01-01), Hashimoto et al.
patent: D377455 (1997-01-01), Burchard et al.
patent: D421653 (2000-03-01), Purcell
patent: D430304 (2000-08-01), Oonuma et al.
patent: D467349 (2002-12-01), Niedbala et al.
patent: D474279 (2003-05-01), Mayer et al.
patent: D491272 (2004-06-01), Alden et al.
patent: D527464 (2006-08-01), Ina et al.
patent: D535403 (2007-01-01), Isozaki et al.
patent: D571385 (2008-06-01), Onuma et al.
patent: D571480 (2008-06-01), Beck et al.
patent: D574280 (2008-08-01), Wakamatsu et al.
patent: D588276 (2009-03-01), Isozaki et al.
patent: D591864 (2009-05-01), Schmidt
patent: D603972 (2009-11-01), Petersen et al.
patent: D607569 (2010-01-01), Yukikado et al.
patent: D608810 (2010-01-01), Stoiakine
patent: D623211 (2010-09-01), Oonuma et al.
patent: D625749 (2010-10-01), Oonuma et al.
patent: D626579 (2010-11-01), Oonuma et al.
U.S. Appl. No. 29/339,397 of Oonuma et al., filed Jun. 30, 2009.
Ajima Masahiko
Ohtaki Tomohisa
Omachi Akira
Oonuma Mitsuru
Antonelli, Terry Stout & Kraus, LLP.
Greene Paula
Hitachi High-Technologies Corporation
LandOfFree
Electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2746840