Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Beam of atomic particles
Patent
1990-11-09
1992-03-17
Harvey, Jack B.
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Beam of atomic particles
324 72, 324 725, G01N 2762
Patent
active
050972006
ABSTRACT:
An electron launching voltage monitor measures MITL voltage using a relationship between anode electric field and electron current launched from a cathode-mounted perturbation. An electron launching probe extends through and is spaced from the edge of an opening in a first MITL conductor, one end of the launching probe being in the gap between the MITL conductor, the other end being adjacent a first side of the first conductor away from the second conductor. A housing surrounds the launching probe and electrically connects the first side of the first conductor to the other end of the launching probe. A detector detects the current passing through the housing to the launching probe, the detected current being representative of the voltage between the conductors.
REFERENCES:
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patent: 4727298 (1988-02-01), Mendel
patent: 4812715 (1989-03-01), Mendel
C. W. Mendel, Jr. et al., "A Simple Theory of Magnetic Insulation from Basic Physical Consideration", Laser and Particle Beams, vol. 1 part 3, pp. 311-320, 3-1983.
P. A. Miller and C. W. Mendel, Jr., "Analytic Model of Applied-B Ion Diode Impedance Behavior", J. Appl. Phys. 61(2), Jan. 15, 1987, pp. 529-539.
Mendel Clifford W.
Savage Mark E.
Harvey Jack B.
Libman George H.
The United States of America as represented by the United States
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