Electron beam writing method, fine pattern writing system,...

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C360S051000, C360S077080, C250S3960ML

Reexamination Certificate

active

07973297

ABSTRACT:
When writing a hard disk pattern on a substrate applied with a resist by scanning an electron beam on the substrate while rotating a rotation stage, writing is started with respect to each radial direction position of each area based on a predetermined encoder pulse for each radial direction position among those generated according to the rotational angle of the rotation stage that occurs after a predefined encoder pulse that occurs ahead in a rotational direction of a radial direction position whose write start position in a circumferential direction in each area arrives first at the writing position as the rotation stage rotates and ahead of the write start position in the circumferential direction with respect to each radial direction position, and after a predetermined time from the predetermined encoder pulse.

REFERENCES:
patent: 6204989 (2001-03-01), Hrinya et al.
patent: 6304407 (2001-10-01), Baker et al.
patent: 6738205 (2004-05-01), Moran et al.
patent: 6954323 (2005-10-01), Deeman et al.
patent: 7218470 (2007-05-01), Deeman et al.
patent: 2006-184924 (2006-07-01), None
patent: 2006184924 (2006-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron beam writing method, fine pattern writing system,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam writing method, fine pattern writing system,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam writing method, fine pattern writing system,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2669248

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.