Electron beam writing method, fine pattern writing system,...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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C250S3960ML, C250S492300, C369S101000, C430S296000, C430S416000, C360S135000

Reexamination Certificate

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07868308

ABSTRACT:
A fine pattern which includes servo patterns, each constituted by servo elements, and groove patterns, each for separating adjacent data tracks, is formed on a substrate applied with a resist and placed on a rotation stage by scanning an electron beam on the substrate. While rotating the substrate in one direction, the electron beam is scanned so as to completely fill servo elements corresponding to a plurality of tracks one by one during one rotation of the substrate by X-Y deflecting the electron beam and vibrating back and forth in the radius direction. Each groove pattern is set as a line-up of a plurality of groove elements divided at a predetermined angle, and groove elements corresponding to the plurality of tracks following the writing of the servo elements are sequentially written by deflection scanning the electron beam largely in a circumferential direction during the same rotation.

REFERENCES:
patent: 7026098 (2006-04-01), Komatsu et al.
patent: 2009/0140162 (2009-06-01), Komatsu et al.
patent: 2009/0140163 (2009-06-01), Komatsu et al.
patent: 2009/0184265 (2009-07-01), Komatsu et al.
patent: 2009/0194711 (2009-08-01), Usa et al.
patent: 2009/0230328 (2009-09-01), Komatsu et al.
patent: 2009/0242788 (2009-10-01), Komatsu et al.
patent: 2010/0237262 (2010-09-01), Usa et al.
patent: 2006-184924 (2006-07-01), None

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