Electron beam method and apparatus for reducing or...

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S492100, C250S492200, C438S031000, C438S032000, C427S542000

Reexamination Certificate

active

11242469

ABSTRACT:
A controlled electron beam and heat will decrease the birefringence of a halogenated optical material under tensile stress. The electron beam and heat irradiation will occur in a chamber under near vacuum conditions. After electron beam irradiation and heating, the crystalline structure of the halogenated optical material layer has been randomized and made amorphous. The electron beam irradiation and heating will lower the high index of refraction of the halogenated optical material under stress and raise the low index of refraction of the halogenated optical material under stress. The differences in index of refraction between the high index of refraction area of and the low index of refraction area decrease which decreases the birefringence of the halogenated optical material under stress.

REFERENCES:
patent: 5003178 (1991-03-01), Livesay
patent: 5572619 (1996-11-01), Maruo et al.
patent: 6132814 (2000-10-01), Livesay et al.
patent: 6607991 (2003-08-01), Livesay et al.
patent: 7026634 (2006-04-01), Livesay et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron beam method and apparatus for reducing or... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam method and apparatus for reducing or..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam method and apparatus for reducing or... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3939356

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.