Electron beam measuring instrument

Details Electron beam measuring instrument Electron beam measuring instrument

1989-05-09

1990-10-16

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

250311, G01R 3128

Patent

active

049638238

ABSTRACT:
Conventional beam blanking system generate electron pulses having a minimum width of about 100 through 200 ps. Although a reduction of the pulse width to a few tens of picoseconds is fundamentally possible, the reduction of the probe current accompanying this would result to a considerable lengthening of the measuring times. In the invention a photo-cathode (PK) is charged by a pulsed laser beam (LA) which is attached to the column of an electron beam measuring instrument and the photo-electron source is stigmatically imaged onto the beam axis (OA1) using a focusing deflection unit (SFM). A sector field magnet is used as a focusing deflection unit (SFM).

REFERENCES:
patent: 4214162 (1980-07-01), Hoppe et al.
patent: 4779046 (1988-10-01), Rouberoi et al.

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