Electron beam lithography system

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

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250398, H01J 3730

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active

056613075

ABSTRACT:
An electron beam lithography system capable of forming an aperture image on a material to be patterned in such a way that the current density distribution throughout the whole image is uniform, the current density is high, and the resolution is high. The system has an electron gun comprising a plurality of needle-like cathodes arranged in an array forming field emission electron sources. Electrons are extracted from the cathodes.

REFERENCES:
patent: 4117340 (1978-09-01), Goto et al.
patent: 4331875 (1982-05-01), Wolfe
patent: 5196707 (1993-03-01), Gesley
"A thermally assisted field emission electron beam exposure system", H. Nakazawa et al., J. Vac. Sci. Technol. B, vol. 6, No. 6, Nov./Dec. 1988, pp. 2019-2022.

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