Electron beam, generating device, and testing device

Details Electron beam, generating device, and testing device Electron beam, generating device, and testing device

2005-06-28

2005-06-28

Le, Hoanganh (Department: 2821)

Electric lamp and discharge devices: systems

Discharge device load with fluent material supply to the...

Electron or ion source

C250S492230

Reexamination Certificate

active

06911780

ABSTRACT:
An electron beam generating device, wherein a high-resistance film is formed on the outer surface of an insulator provided with a cathode for emitting thermal electrons and a grid for collecting thermal electrons and forming an electron beam to allow a feeble current to flow to the high-resistance film, thereby preventing the accumulation of thermal electrons on the insulator and discharging. The upper portion of the high-resistance film connected to a chamber supplies an approximate reference potential to the upper portion of the film, and the lower portion of the high-resistance film connected to the grid supplies almost the same potential as that of the grid to the lower portion of the film to allow a feeble current to flow to the film. The prevention of accumulation of thermal electrons on the insulator can prevent discharging, accurately control the current capacity of an electron beam, and give the electron beam generating device a longer service life.

REFERENCES:
patent: 5003178 (1991-03-01), Livesay
patent: 6407399 (2002-06-01), Livesay
patent: 6504159 (2003-01-01), Keller
patent: 6617593 (2003-09-01), Lien
patent: 40-25466 (1965-08-01), None
patent: 58-103134 (1983-06-01), None
patent: 7-223814 (1995-08-01), None
patent: 11-87206 (1999-03-01), None

Affiliated with

Also associated with

Rating

Electron beam, generating device, and testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam, generating device, and testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam, generating device, and testing device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3492039