Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-12-11
2007-12-11
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11001351
ABSTRACT:
An optical sampling apparatus has an electron beam generating apparatus which generates an electron beam by irradiating a cathode with an optical signal, a deflection electrode which deflects the generated electron beam, a sampling slit which transmits a part of the deflected electron beam, and a charge detection section which detects the quantity of charges or accumulated current of the transmitted electron beam. It is possible to perform accurate sampling in a high band.
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Kobayashi Shinji
Miura Akira
Oka Sadaharu
Tezuka Kentaro
Yakihara Tsuyoshi
Hollington Jermele
Sughrue Mion Pllc.
Yokogawa Electric Corporation
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