Electron beam exposure apparatus and a method for electron beam

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

H01J 37302

Patent

active

056441380

ABSTRACT:
An electron beam exposure apparatus comprising: exposure computing means for outputting main-exposure data and sub-exposure data, the former of which expose non-reversal image area of a depiction pattern, the other of which expose reversal image area of the depiction pattern respectively; and electron beam optics means for emitting electron beams and deflecting thereof onto workpiece to be exposed according to the main exposure data and sub-exposure data from the exposure computing means.

REFERENCES:
patent: 4520269 (1985-05-01), Jones
patent: 4943729 (1990-07-01), Ando et al.
patent: 5082762 (1992-01-01), Takahashi
patent: 5210696 (1993-05-01), Yano
patent: 5278419 (1994-01-01), Takahashi et al.
patent: 5305225 (1994-04-01), Yamaguchi et al.
patent: 5369282 (1994-11-01), Arai et al.
patent: 5430304 (1995-07-01), Yasuda et al.
patent: 5448075 (1995-09-01), Fueki et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron beam exposure apparatus and a method for electron beam does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam exposure apparatus and a method for electron beam , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam exposure apparatus and a method for electron beam will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-599460

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.