Electron beam exposure apparatus

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

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250398, H01J 37304

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active

050830325

ABSTRACT:
Stored in the magnetic disk are the lithography data for lithographing a mask pattern and the correction data for correcting the lithography data. The CPU reads the lithography data and correction data from the magnetic disk and compares addresses from the different sources. When the two separate addresses coincide, the electro-optic system lithographs the mask pattern based on the correction data, whereas when the two addresses disagree with each other, it lithographs the mask pattern according to the lithography data.

REFERENCES:
patent: Re33193 (1990-04-01), Yamaguchi et al.
patent: 4678919 (1987-07-01), Sugishima et al.
patent: 4879473 (1989-11-01), Zumoto et al.

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