Electron beam excited superconducting analog-to-digital...

Coded data generation or conversion – Analog to or from digital conversion

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C341S012000, C250S492200

Reexamination Certificate

active

06980142

ABSTRACT:
A system and method for converting an analog voltage signal to a digital representation at high speeds, known as an analog to digital converter (A/D converter), is provided in the form of an N-bit A/D converter, made by N superconducting, preferably HTC, transmission lines. The N lines are arranged adjacently and in parallel with each other. On each line 2N−1Josephson Junctions (JJs) are embedded in series. The JJs form a matrix over the configuration of the N superconducting transmission lines. A scanning electron beam is made to impinge on this arrangement across the lines at a high frequency, while it is deflected by the applied voltage signal along the direction of the lines. A voltage step is generated upon hitting any one of the JJs. In this manner upon each cross-scanning of the beam, an N-bit step voltage pattern is generated on the lines.

REFERENCES:
patent: 4034363 (1977-07-01), Van Etten et al.
patent: 4163156 (1979-07-01), Daetwyler et al.
patent: 6356221 (2002-03-01), LeChevalier

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron beam excited superconducting analog-to-digital... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam excited superconducting analog-to-digital..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam excited superconducting analog-to-digital... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3500182

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.