Electron beam duplication lithography method and apparatus

Radiant energy – Irradiation of objects or material

Reexamination Certificate

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C250S492210, C250S398000, C313S309000, C445S050000

Reexamination Certificate

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06849856

ABSTRACT:
An electron beam duplication lithography apparatus and method for focusing electrons emitted from a mask plate as a result of an application of an electric field between a mask plate and a duplication plate. Irradiation of electrons from the mask plate is assisted through an electric field lens or magnetic field lens, or a combination thereof from an electron field emission material formed into a pattern on a flat surface of a substrate. The result is that a congruent or similar pattern is lithographed by electron beam exposure onto an electron beam resist film from a field emission film having the congruent or similar pattern to be created.

REFERENCES:
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patent: 4857161 (1989-08-01), Borel et al.
patent: 5245248 (1993-09-01), Chan et al.
patent: 5461009 (1995-10-01), Huang et al.
patent: 5743998 (1998-04-01), Park
patent: 5892231 (1999-04-01), Baylor et al.

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