Electron beam deflecting apparatus with reduced settling time pe

Radiant energy – Invisible radiant energy responsive electric signalling – Flow metering

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250356MC, 2504922, H01J 3710, H01J 37147

Patent

active

055302505

ABSTRACT:
In an electron beam deflecting apparatus including an electromagnetic deflection unit and a driver for driving the electromagnetic deflection unit in accordance with a main deflection amount, when a current main deflection amount is different from a previous main deflection amount, a corrected main deflection amount, which is an opposite value of the previous main deflection amount with respect to the current main deflection amount, is calculated as the main deflection amount.

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Y. Takahashi et al., "Electron beam lithography system with new correction techniques", J. Vac. Sci. Technol. B, vol. 10, No. 6, Nov./Dec. 1992, pp. 2794-2798.

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