Electromigration tester for high capacity and high current

Details Electromigration tester for high capacity and high current Electromigration tester for high capacity and high current

2008-02-19

2009-10-13

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S1540PB, C327S321000, C327S322000, C361S091500, C361S093900

Reexamination Certificate

active

07602205

ABSTRACT:
An electronic device under test (DUT) may be incorporated into a circuit having a voltage limiter connected in parallel with the DUT. The circuit includes a controlled current source having an output current connected in series with the DUT. The voltage limiter is characterized in that, when the output current is such that the voltage across the DUT (Vdut) would exceed a particular maximum voltage Vmax, without the voltage limiter in place, at least a portion of the output current flows through the voltage limiter, so as to limit Vdut to be less than or equal to Vmax. When the output current is such that Vdut would be less than or equal to Vmax, current does not flow through the voltage limiter. The circuit may include a plurality of DUTs, each DUT connected in series with the output current of a controlled current source, with a voltage limiter connected in parallel with each DUT.

REFERENCES:
patent: 4628268 (1986-12-01), Matsubara
patent: 6087817 (2000-07-01), Varga
patent: 6480978 (2002-11-01), Roy et al.
patent: 6614251 (2003-09-01), Ootsuji
patent: 6819124 (2004-11-01), Allee et al.
IBM Technical Disclosure Bulletin Sep. 1971, NN71091070.
BM Technical Disclosure Bulletin Jan. 1985, NN85014744.
International Search Report from PCT/US2008/087009, mailed Feb. 3, 2009.
Written Opinion from PCT/US2008/087009, mailed Feb. 3, 2009.

Affiliated with

Also associated with

Rating

Electromigration tester for high capacity and high current does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electromigration tester for high capacity and high current, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electromigration tester for high capacity and high current will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4109008