Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-08-08
2006-08-08
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S136000, C702S118000, C702S064000, C702S060000, C716S030000, C716S030000
Reexamination Certificate
active
07089129
ABSTRACT:
A method for performing an electromigration check and detecting EM problems in a device or circuit. The method uses the capacitance and resistance of the conductors of the device or circuit as parameters in determining a power limit that maintains a required temperature environment that ensures the reliability of the device or circuit. The power limit is then used to check each device interconnect to identify the location of potential EM problems. Corrective action is taken to avoid EM problems as they are detected in the device or circuit.
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Connolly Bove & Lodge & Hutz LLP
Wachsman Hal
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