Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1974-12-16
1976-01-27
Kominski, John
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324 295, 320 48, G01R 3102
Patent
active
039355314
ABSTRACT:
An electrometer system particularly adapted for non-contact measurement of electrostatic charges in electrostatography, such as the charge level on photoreceptor surface areas in xerographic machines. The electrometer circuit has a very high impedance normally floating input, and a simple D.C. measurement circuit. The measurement circuit output can be read by a conventional test meter. The electrometer is controlled by a simple switching arrangement providing an automatic zeroing position in which the initial level of the input circuit is automatically reset by a feedback amplifier from the output to compensate for any temperature induced or other variations in the measurement circuit. The power supply voltage is automatically monitored and the output meter is driven to a non-zeroing position in response to a low supply voltage by a feedback amplifier circuit operative only in the zeroing position, overriding the automatic zeroing circuit.
REFERENCES:
patent: 3118137 (1964-01-01), Vincent
patent: 3832629 (1974-08-01), Cernek
Kominski John
Tokar Michael J.
Xerox Corporation
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